University of Arkansas-Nano Mechanics and Tribology Laboratory

Type	Disciplines
Private University	Physics Quantum Dots Nanostructures Nanomaterials
Address	Postal Code
Department of Mechanical Engineering University of Arkansas	72701
City	State / Province
Fayetteville	AK
E-mail	Country
	USA
Web	Phone
link	(479) 575-2000
Fax

The NMTL is interested in the materials of technological relevance, which include: Semiconductor bulk and nanomaterials, especially quantum dots, wires, and films. Applications include nanolasers, solar cells, single-electron transistors, nanomechanical devices, and DNA-sequence labeling.

AREAS OF FOCUS
The University of Arkansas-Nano Mechanics and Tribology Laboratory's current research projects are in the area of nano-surface-engineering for tribological and biomedical applications, with emphasis on fabrication and nanomechanical and tribological characterization.

CURENT PROJECTS
Among NMTL's current and on-going research projects are:

• Nano-surface-engineering by Crystallization of Amorphous Silicon
• Nano-surface-engineering by Spin Coating of Colloidal Nanoparticles
• Nano-surface-engineering by Physical Vapor Deposition
• Nano-surface-engineering for Bacteria Attachment
• Nano-surface-engineering for Superhydrophobic Applications
• Nano/Micro Tribology of Nano-engineered Surfaces
• Nanomechanical Characterization of Nanostructures and Thin Films
• Fabrication and Characterization of Biomaterials

RESEARCH AND COLLABORATION FACILITIES
The research group has access to various facilities on the University of Arkansas campus. The facilities related to our research from Nanomechanics and Tribology Laboratory, Arkansas Analytical Lab, High Density Electronics Center (HiDEC), and Mechanical Engineering Educational Lab are listed below:

Nanoindenter with in-situ SPM imaging and high load capabilities
OCA 15 plus video-based optical contact angle measuring device
Materials Synthesizing and Processing Furnace
Digital Instruments Dimension 3000 AFM/SPM
Philips XL30 ESEM-FEGHitachi S-2300-I SEM with Kevex Mark III X-ray microanalysis (EDX)
Philips X'Pert x-ray diffractometer (XRD)
Kratos x-ray photoelectron spectrometer (XPS)
Nikon and Olympus microscopes
TekTek Surface Profiler
Tencor FLX-2320A thin film stress measurement system
Raman and micro-Raman Spectrometer with Coherent laser
Hughes ellipsometer
Inframetrics IR Thermacam PM180 thermal imaging system
Micro-hardness Tester
High Temperature Furnace (1700ºC)

NanoScienceWorks