Peter Cumpson Ph.D.

Cumpson, Peter
Position Department / Business Unit
Surface and Nano-Analysis
Institution Disciplines
National Physical Laboratory Physics
City State / Provence
Teddington Middlesex
Country Website
United Kingdom link
Fax
+44 (0)20 8614 0434

Peter's work at NPL centred initially on the Quartz Crystal Microbalance (QCM) and X-ray photoelectron spectroscopy (XPS), especially its angle-resolved variant, ARXPS, both the improved metrology of the spectroscopy itself and in the application of ARXPS to metrological problems in mass standards. He has a growing interest in scanned-probe microscopies and near-field optics. In addition, Micro-Elecromechanical (MEMS) devices have been a recent area of expansion, designed and used in support of the above surface and nano-analytical techniques, and echoing the earlier synergy of XPS and QCM.

Peter is a Member of the Institute of Physics and American Vacuum Society.

Education

Peter received BA and PhD degrees in Physics from the University of Cambridge.

By this Researcher