NanoScienceWorks

Peter Cumpson Ph.D.

Position	Department / Business Unit
	Surface and Nano-Analysis
Institution	Disciplines
National Physical Laboratory	Physics
City	State / Provence
Teddington	Middlesex
Country	Website
United Kingdom	link
Fax
+44 (0)20 8614 0434

Peter's work at NPL centred initially on the Quartz Crystal Microbalance (QCM) and X-ray photoelectron spectroscopy (XPS), especially its angle-resolved variant, ARXPS, both the improved metrology of the spectroscopy itself and in the application of ARXPS to metrological problems in mass standards. He has a growing interest in scanned-probe microscopies and near-field optics. In addition, Micro-Elecromechanical (MEMS) devices have been a recent area of expansion, designed and used in support of the above surface and nano-analytical techniques, and echoing the earlier synergy of XPS and QCM.

Peter is a Member of the Institute of Physics and American Vacuum Society.

Education

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