Fei Su Ph.D.
| Position |
Department / Business Unit |
| Senior design-for-test (DFT) Engineer |
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| Institution |
Disciplines |
| Intel Corporation |
Engineering Nanobiology |
| City |
State / Provence |
| Folsom |
California |
| Country |
Website |
| US |
link
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Dr. Su's research interests include design-for-test (DFT), testing and computer-aided design (CAD) for SoC and mixed microsystems, mixed signal circuit design.
Dr. Su has published over 30 papers in journals and referred conference proceedings (including ITC, VTS, DAC, ICCAD, DATE). He is a recipient of European Design Automation Association (EDAA) Outstanding Dissertation Award 2006 and the Best Paper Award at the 2007 IEEE International Conference on VLSI Design. He is a member of IEEE TTTC (Test Technology Technical Council). He also serves as an invited reviewer of IEEE Transactions on CAD, IEEE Design & Test of Computers, ACM Journal on Emerging Technologies in Computing Systems and IEEE/ACM Design Automation Conference.
Education
2006, Ph.D. Electrical and Computer Engineering, Duke University; 2003, M.S.,Electrical and Computer Engineering, Duke University; 2001, M.S., Detection and Automation Devices; 1999, B.S., Automation Tsinghua University.
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