Fei Su Ph.D.

Position Department / Business Unit
Senior design-for-test (DFT) Engineer
Institution Disciplines
Intel Corporation Engineering Nanobiology
City State / Provence
Folsom California
Country Website
US link
Fax

Dr. Su's research interests include design-for-test (DFT), testing and computer-aided design (CAD) for SoC and mixed microsystems, mixed signal circuit design.

Dr. Su has published over 30 papers in journals and referred conference proceedings (including ITC, VTS, DAC, ICCAD, DATE). He is a recipient of European Design Automation Association (EDAA) Outstanding Dissertation Award 2006 and the Best Paper Award at the 2007 IEEE International Conference on VLSI Design. He is a member of IEEE TTTC (Test Technology Technical Council). He also serves as an invited reviewer of IEEE Transactions on CAD, IEEE Design & Test of Computers, ACM Journal on Emerging Technologies in Computing Systems and IEEE/ACM Design Automation Conference.

Education

2006, Ph.D. Electrical and Computer Engineering, Duke University; 2003, M.S.,Electrical and Computer Engineering, Duke University; 2001, M.S., Detection and Automation Devices; 1999, B.S., Automation Tsinghua University.

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