Handbook of Surface and Interface Analysis: Methods for Problem-Solving [2nd Edition]

Handbook of Surface and Interface Analysis: Methods for Problem-Solving  [2nd Edition]
Publication Type List Price
Reference $199.95 / £121.00
Publication Date Imprint
June 2009 CRC
Disciplines ISBN
General 9780849375583
Number of Pages Buy with discount
671 buy


The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors’ firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.

Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.

New information in Handbook of Surface and Interface Analysis: Methods for Problem-Solving--Second Edition includes:

  • Electron-optical imaging techniques and associated analytical methods
  • Techniques based on synchrotron sources
  • Convenient and versatile scanning probe group methods
  • Scanning tunneling microscopy, biocompatible materials, and nano-structured materials

Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications—the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.


Table of Contents

  • Introduction, J. C. Rivière and S. Myhra
  • Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Rivière
  • Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund
  • Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading
  • Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra
  • Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments, J. M. Titchmarsh
  • Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince
  • Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard
  • Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh
  • In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell
  • Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston
  • Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin
  • Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild
  • Composites, P. M. A. Sherwood
  • Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang
  • Catalyst Characterization, W. E. S. Unger and T. Gross
  • Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser
  • Adhesion Science and Technology, J. F. Watts
  • Electron Spectroscopy in Corrosion Science, J. E. Castle

by Editor1 last modified October 04, 2009 - 17:25
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