Engineering Thin Films and Nanostructures with Ion Beams

Emile Knystautas C.I.V.E.N. (Coordinamento Interuniversitario Veneto per le Nanotecnologie)
Engineering Thin Films and Nanostructures with Ion Beams
Publication Type List Price
Reference $164.95 / £105
Publication Date Imprint
4/6/2005 CRC
Disciplines ISBN
Nanostructures 9780824724474
Number of Pages Buy with discount
592 buy
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Description

Engineering Thin Films and Nanostructures with Ion Beams first focuses on the mechanisms of individual ion impacts upon their substrates. It addresses current challenges in building equipment needed to produce nanostructures in an industrial setting and examines the combination of ion-beam techniques, delineates the fabrication of nanopillars, nanoflowers, and interconnected nanochannels in three dimensions by using atomic shadowing techniques, and describes the production of nanopores of varying dimensions in polymer films alloys and superconductors using ion-beam irradiation. The last chapter shows how fingerprints can be made more reliable as forensic evidence by recoil-mixing them into the substrate using ion beams.

Table of Contents

Introduction, Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation, on Beam Effects in Magnetic Thin Films, Selected Topics in Ion Beam Surface Engineering, Optical Effects of Ion Implantation, Metal Alloy Nanoclusters by Ion Implantation in Silica, Intrinsic Residual Stress Evolution in Thin Films During Energetic Particle Bombardment, Industrial Aspects of Ion Implantation Equipment and Ion Beam Generation, Nanostructured Transition-Metal Layers, Nuclear Tracks and Nanostructures, Forensic Applications of Ion-Beam Mixing and Surface Spectroscopy of Latent Fingerprints, Glossary

Contributors

Contributor Baglin, John, IBM Almaden Research Center, California, USA Contributor Koch, Charles H. Jim, University of Connecticut, Storrs, USA Contributor Townsend, P. D., University of Sussex, Brighton, England, UK Contributor Mazzoldi, Paolo, Universita di Padova, Italy Contributor Cattaruzza, Elti, Instituto Nazionale Per La Fisica Della Materia, Venezia, It Contributor Gonella, Francesco, Universita Di Venezia, Italy Contributor Mattei, Giovanni, Universita Di Padova, Italy Contributor Maurizio, Chiara, Universita Di Padova, Italy Contributor Fenner, David B., Westford, Massachusetts, USA Contributor Matsuda, Koji, Nissin Ion Equipment Co., Ltd., Kyoto, Japan Contributor Misra, Amit, Los Alamos National Laboratory, New Mexico, USA Contributor Fleischer, Robert L., Union College, Schenectady, New York, USA Contributor Gall, Daniel, Rensselaer Polytechnic Institute, Troy, New York, USA Contributor Nastasi, Michael, Los Alamos National Laboratory, New Mexico, USA Contributor Nordlund, K., University of Helsenki, Finland Contributor Nunn, P. J. T., University of Sussex, Brighton, England, UK Contributor Donnelly, S. E., University of Salford, Manchester, UK Contributor Birtcher, Robert C., Argonne National Laboratory, Illinois, USA Contributor Hirvonen, James, U.S. Army Research Lab, Aberdeen, Maryland, USA Contributor Tanjyo, Masayasu, Nissin Ion Equipment Co., Ltd., Kyoto, Japan Contributor Demaree, John Derek, Army Research Laboratory, Aberdeen Proving Ground, Maryland, Editor 1 Knystautas, Emile, CIVEN, Venice, Italy
by siebo last modified September 22, 2009 - 13:13
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Features

  • - Recent research emphasizing the customized creation of structures on the nano-scale
  • - The effect of stresses generated by ion-beam methods, often ignored in the literature
  • - 200 tables and a complete, up-to-date glossary of terms and acronyms used in the book
  • - CD-ROM with video clips from an electron microscope that details crater formation and annealing by ion beams