Thermoelectrics Handbook: Macro to Nano

D. Mike Rowe Institute of Advanced Materials and Energy Systems
Thermoelectrics Handbook: Macro to Nano
Publication Type List Price
Reference $175.95 / £111
Publication Date Imprint
12/9/2005 CRC
Disciplines ISBN
Electronics 9780849322648
Number of Pages Buy with discount
1014 buy
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Description

Ten years ago, D.M. Rowe introduced the bestselling CRC Handbook of Thermoelectrics to wide acclaim. Since then, increasing environmental concerns, desire for long-life electrical power sources, and continued progress in miniaturization of electronics has led to a substantial increase in research activity involving thermoelectrics. Reflecting the latest trends and developments, the Thermoelectrics Handbook: Macro to Nano is an extension of the earlier work and covers the entire range of thermoelectrics disciplines.

Serving as a convenient reference as well as a thorough introduction to thermoelectrics, this book includes contributions from 99 leading authorities from around the world. Its coverage spans from general principles and theoretical concepts to material preparation and measurements; thermoelectric materials; thermoelements, modules, and devices; and thermoelectric systems and applications. Reflecting the enormous impact of nanotechnology on the field-as the thermoelectric properties of nanostructured materials far surpass the performance of conventional materials-each section progresses systematically from macro-scale to micro/nano-scale topics. In addition, the book contains an appendix listing major manufacturers and suppliers of thermoelectric modules.

There is no longer any need to spend hours plodding through the journal literature for information. The Thermoelectrics Handbook: Macro to Nano offers a timely, comprehensive treatment of all areas of thermoelectrics in a single, unified reference.

Table of Contents

General Principles and Theoretical Considerations. Material Preparation and Measurements. Thermoelectric Materials. Thermoelements, Modules and Devices. Thermoelectric Systems and Applications. Appendix I: History of the International Thermoelectric Society. Appendix II: Selected Thermoelectric Sources.

Contributors

Contributor Bhandari, Chandra Mohan, Allahahad University Contributor Emin, David, Sandia National Laboratory, Albuquerque, New Mexico, USA Contributor Boettner, Harald, Fraunhofer Institut fur Physikalische , Freiburg, Germany Contributor Voelklein, Friedemann, University of Applied Sciences, Russelsheim, Germany Contributor Snarski, Andrei A., KPI, Kiev, Ukraine Contributor Rogl, Peter, University of Vienna, Austria Contributor Semenyuk, Vladimir, Thermion Company, Odessa, Ukraine Contributor Snyder, G. Jeffrey, California Institute of Technology, Pasadena, USA Contributor Uher, Ctirad, Contributor Iversen, Bo Brummerstedt, University of Aarhus, Denmark Contributor Pipe, Kevin Patrick, University of Michigan, Ann Arbor, USA Contributor Burkov, Alexander T., A.F. Ioffe Physico-Technical Institute, Sankt-Petersburg, Ru Contributor Fedorov, Mikhail I., Ioffe Institute, Sankt-Petersburg, Russia Contributor Grabov, Vladimir M., Herzen Russian State Pedagogical University, St. Petersburg Contributor Ivanov, Yuri V., A.F. Ioffe Physico-Technical Institute, St. Petersburg, Russ Contributor Zaitsev, Vladimir K., Ioffe Institute, Sankt-Petersburg, Russia Contributor Tritt, Terry M., Clemson University, South Carolina, USA Contributor Kuznetsov, Vladimir L., University of Oxford, UK Contributor Casian, Anatolie I., Contributor Kucherov, Yan, ENECO, Inc., Salt Lake City, Utah, USA Contributor Anatychuk, Lukian Ivanovyc, Institute of Thermoelectricity, Chernivtsi, Ukraine Contributor Pustovalov, A.A., BIAPOS, Moscow, Russia Contributor Balandin, Alexander A., University of California, Riverside, USA Contributor Nolas, George, University of South Florida, Tampa Contributor Chen, Gang, Massachusetts Institute of Technology, Cambridge, USA Contributor Zhao, X.B., Zhejiang University, Hangzhou, Peoples Republic of China Contributor Abelson, Robert D., Jet Propulsion Laboratory, Pasadena, California, USA Contributor Banney, Benjamin P., Hydrocool Pty. Ltd., Fremantle, Western Australia Contributor Cook, Bruce Allen, Iowa State University, Ames, USA Contributor Dresselhaus, Mildred S., Massachusetts Institute of Technology, Cambridge, USA Contributor El-Genk, Mohamed S., University of New Mexico, Albuquerque, USA Contributor Hogan, Timothy P., Michigan State University, East Lansing, USA Contributor Issi, Jean-Paul, Universite Catholique de Louvain, France Contributor Kajikawa, Takenobu, Shonan Institute of Technology, Kanagawa, Japan Contributor Koumoto, Kunihito, Nagoya University, School of Engineering, Japan Contributor Mahan, Gerald D., Contributor Matsubara, Kakuei, Science University of Tokyo, Onoda, Japan Contributor Min, Gao, University of Wales, Cardiff, UK Contributor Tse, John S., University of Saskatchewan, Saskatoon, Canada Contributor Goldsmid, H. Julian, University of New South Wales, Australia Contributor Venkatasubramanian, Rama, Research Triangle Institute, North Carolina, USA Contributor Mueller, Eckhard, German Aerospace Center (DLR), Koln, Germany Contributor Belov, Yury M., Crystal Ltd., Korolev, Moscow Region, Russia Contributor Nurnus, Joachim, Fraunhofer Institut Physikalische Messtechnik, Freiburg, Ger Contributor Muhammed, Mamoun Ahmed, Royal Institute of Technology KTH, Stockholm, Sweden Contributor Schumann, Joachim, A Leibnitz Inst. of Solid State & Materials Research, German Contributor Bertini, Luca, CNR-ISTM, Milano, Italy Contributor Scherrer, Hubert, Laboratorie de Physique des Materiaux, Nancy, France Contributor Ghamaty, Saeid, Hi-Z Technology, Inc., San Diego, California, USA Contributor Buehler-Paschen, Silke, Vienna University of Technology, Austria Contributor Gatti, Carlo, CNR-ISTM Istituto di Scienze e Tecnologie Molecolari, Milano Contributor Stockholm, John G., Contributor Bulat, Lev Petrovich, SPbSUR&FE, St. Petersburg, Russia Contributor Eremin, Ivan S., Ioffe Institute, Sankt-Petersburg, Russia Contributor Gurieva, Elena A., Ioffe Institute, Sankt-Petersburg, Russia Contributor Lukyanova, L.N., A.F. Ioffe Physical-Technical Institute, Sankt-Petersburg,Ru Contributor Uryupin, Oleg N., A.F. Ioffe Physico-Technical Institute, St. Petersburg, Russ Contributor Vedernikov, Marat V., A.F. Ioffe Phys-Tech Inst/RAS, Sankt-Petersburg, Russia Contributor Luste, Oleg J., Institute of Thermoelectricity, Chernivtsi, Ukraine Contributor Cargnoni, Fausto, CNR-ISTM, Milano, Italy Contributor Blumers, Matthias, University of Applied Sciences, Wiesbaden, Germany Contributor Clarke, Peter T., Hydrocool Ltd., Fremantle, Western Australia Contributor Hagelstein, Peter L., Massachusetts Institute of Technology, Cambridge, USA Contributor Harringa, Joel Lee, Iowa State University, Ames, USA Contributor Kajitani, Tsuyoshi, Tohoku University, Japan Contributor Klug, Dennis D., National Research Council Canada, Ottawa, Ontario, Canada Contributor Manyakin, Sergei M., Crystal Ltd., Korolev/Moscow Region, Russia Contributor Matsuura, Mitsuru, Yamaguchi University, Japan Contributor Ohtaki, Michitaka, Kyushu University, Fukuoka, Japan Contributor Funahashi, Ryoji, National Institute of Science & Technogy, Osaka, Japan Contributor Saber, Hamed, InCoreTec Incorporated, St. John's, Newfoundland, Canada Contributor Scherrer, Stanislas, Ecole des Mines de Nancy, France Contributor Shih, Tom I-P., Iowa State University, Ames, USA Contributor Toprak, Muhammet, KTH Royal Institute of Technology, Stockholm, Sweden Contributor Terasaki, Ichiro, University of Bristol, UK Contributor Vining, Cronin B., ZT Services, Inc., Auburn, Alabama, USA Contributor Manners, Brett R., Hydrocool Pty. Ltd., Fremantle, Western Australia Contributor Weymouth, Robert M., Hydrocool Pty. Ltd., Fremantle, Western Australia Contributor Siivola, Edward, Research Triangle Institute, North Carolina, USA Contributor Ji, X.H., Clemson University, South Carolina, USA Contributor Lambrecht, Armin, Fraunhofer Inst. Physikalische, Freiburg, Germany Contributor Rao, Kamisetty Ramam, University of Texas at Arlington, USA Contributor Schubert, Axel, Infineon Technologies AG, Munchen, Germany Contributor Stiewe, Christian, German Aerospace Centre (DLR), Koln, Germany Contributor Williams, S.G. Keith, University of Cardiff, Wales, UK Contributor Zhu, T.J., Zhejiang University, Hangzhou, Peoples Republic of China Contributor Elsner, Norber B., Hi-Z Technology, Inc., San Diego, California, USA Contributor Bass, Jack C., Hi-Z Technology, Inc., San Diego, California, USA Contributor Meier, Andreas, University of Applied Sciences, Ruesselsheim, Germany Contributor Morgunov, Igor V., Crystal Ltd., Korolov, Moscow Region, Russia Contributor O'Quinn, Brooks, Research Triangle Institute, North Carolina, USA Contributor Kutasov, V.A., Ioffe Physical-Technical Institute, St. Petersburg, Russia Contributor Dames, Chris, Massachusetts Institute of Technology, Cambridge, USA Editor 1 Rowe, D.M., University of Cardiff, Wales, UK
by siebo last modified September 14, 2009 - 13:33
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Features

  • - Provides comprehensive and detailed expert information on all facets of thermoelectrics in a single, unified reference
  • - Presents a systematic description of the major disciplines of thermoelectrics in clearly identified sections
  • - Follows the evolution of the field by outlining each section from macro-scale to micro/nano-scale topics
  • - Contains thousands of references, hundreds of tables, and a thorough list of manufacturers and suppliers of thermoelectric modules