Quantum Dots, Self-Formed: Structural and Optical Characterization

Authors

Hajime Asahi Institute of Scientific and Industrial Research, Osaka University

Publication Date

4/13/04

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Abstract

There are various methods for the fabrication of quantum dots (QD). Among them, the self-formation method is one of the most useful methods, because it causes little damage, creates dots of high density, and the fabrication process is rather simple. In this article, two fabrication methods, i.e., the S–K mode growth method and the composition modulation of short-period superlattices, are introduced. For samples fabricated by these methods, structural characterization with atomic force microscopy (AFM), scanning tunneling microscopy/spectroscopy (STM/STS), magnetic force microscopy (MFM), and transmission electron microscopy (TEM) are described. Furthermore, as optical characterization methods, photoluminescence (PL), time-resolved photoluminescence (TRPL), and electroluminescence (EL) are mentioned and the several results are shown.