Radiation damage bigger problem in microelectronics than previously thought

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Radiation damage bigger problem in microelectronics than previously thought

Description (Vanderbilt University) The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to that allows scientists to peer through solid materials to pinpoint the size and location of detects buried deep inside with unprecedented precision.
Imported on 28 Jul 2012, 10:59
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